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X-Ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, Würzburg, August 19–23, 1996

Name: X-Ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, Würzburg, August 19–23, 1996
ISBN: 9783642721083

W. Meyer-Ilse, H. Medecki, J. T. Brown, J. M. Heck, E. H. Anderson, A. Stead, T. Ford (auth.), Dr. Jürgen Thieme, Professor Dr. Günter Schmahl, Dr. Dietbert Rudolph, Professor Dr. Eberhard Umbach (eds.)

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This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities in a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. The book appeals to researchers who are active in microscopic and spectromicroscopic studies.

Категорії:

Engineering

Рік:

1998

Видання:

Видавництво:

Springer-Verlag Berlin Heidelberg

Мова:

english

Сторінки:

383

ISBN 10: